Method and apparatus for treating substrate

The inventive concept provides a method for treating a substrate. The method includes removing a film on the substrate by applying a pulsed laser to the rotating substrate, in which thickness of the film to be removed is measured and pulse energy of the pulsed laser is selected based on the measured...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Kwon, Ohyeol, Lee, Jung Hwan, Park, Soo Young, Ahn, Jun Keon
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:The inventive concept provides a method for treating a substrate. The method includes removing a film on the substrate by applying a pulsed laser to the rotating substrate, in which thickness of the film to be removed is measured and pulse energy of the pulsed laser is selected based on the measured thickness of the film.