Crop yield estimation

The present disclosure provides for crop yield estimation by identifying, via image processing, a field in which a crop is grown; identifying a plurality of regions within the field; identifying, by processing growth metrics via a model, a plurality of data collection points in the plurality of regi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Appel, Ana Paula, Silva, Bruno, Rodrigues, Eduardo Rocha, De Freitas Cunha, Renato Luiz
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure provides for crop yield estimation by identifying, via image processing, a field in which a crop is grown; identifying a plurality of regions within the field; identifying, by processing growth metrics via a model, a plurality of data collection points in the plurality of regions, wherein a given data collection point of the plurality of data collection points within a given region of the plurality of regions is identified by multivariate analysis as representative of growing conditions in the given region; receiving in-field data linked to the data collection points of the plurality; and predicting a yield for the crop in the field based on the in-field data.