Generating digital models of crop yield based on crop planting dates and relative maturity values

Methods are provided for improving performance of a computing system used to model potential crop yield. In one example embodiment, a computer-implemented method includes generating a model of potential crop yield, as a function of planting date and relative maturity based, at least in part, on one...

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Hauptverfasser: Andrejko, Erik, Xu, Ying
Format: Patent
Sprache:eng
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Zusammenfassung:Methods are provided for improving performance of a computing system used to model potential crop yield. In one example embodiment, a computer-implemented method includes generating a model of potential crop yield, as a function of planting date and relative maturity based, at least in part, on one or more relative maturity maps, one or more planting date maps, and one or more actual production history maps, and storing the model in a memory of the server computer system. The method also includes receiving, via an interface at a field manager computing device, a selection of a particular field and computing, from the model of potential crop yield, a potential yield for the particular field based, at least in part, on a planting date for the particular field, a relative maturity value, and values representing actual production history for the particular field.