Topogram-based fat quantification for a computed tomography examination

In one embodiment, a method is for calculating an examination parameter for a computed tomography examination of an area of interest of a patient. The method includes receiving a topogram of the area of interest of the patient; determining fat distribution information by applying a trained machine l...

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Bibliographische Detailangaben
Hauptverfasser: Schmidt, Bernhard, Flohr, Thomas, Grasruck, Michael
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:In one embodiment, a method is for calculating an examination parameter for a computed tomography examination of an area of interest of a patient. The method includes receiving a topogram of the area of interest of the patient; determining fat distribution information by applying a trained machine learning algorithm onto the topogram; and calculating the examination parameter for the computed tomography examination of the area of interest of the patient based on the fat distribution information.