Optimized storage charge loss management

A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including initiating a read operation with respect to a block of the memory device, selecting, based on a set of criteria, a default read offset from a set of read offsets, wh...

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Bibliographische Detailangaben
Hauptverfasser: Malshe, Ashutosh, Smitchger, Christopher M, Miller, Michael G, Padilla, Renato C, Besinga, Gary F, Ratnam, Sampath K, Rayaprolu, Vamsi Pavan, Opastrakoon, Tawalin
Format: Patent
Sprache:eng
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Zusammenfassung:A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including initiating a read operation with respect to a block of the memory device, selecting, based on a set of criteria, a default read offset from a set of read offsets, wherein the set of criteria includes at least one of: a parameter related to trigger rate, or an amount of time that an open block is allowed to remain open to control threshold voltage shift due to storage charge loss, and applying the default read offset to a read operation performed with respect to the block.