Independent control of stacked semiconductor device

The present disclosure describes a semiconductor device includes a first fin structure, an isolation structure in contact with a top surface of the first fin structure, a substrate layer in contact with the isolation structure, an epitaxial layer in contact with the isolation structure and the subst...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Yang, Chan-Lon, Yang, Chansyun David, Chang, Keh-Jeng
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure describes a semiconductor device includes a first fin structure, an isolation structure in contact with a top surface of the first fin structure, a substrate layer in contact with the isolation structure, an epitaxial layer in contact with the isolation structure and the substrate layer, and a second fin structure above the first fin structure and in contact with the epitaxial layer.