Methods and apparatus for warpage correction

Methods and apparatus for processing a substrate are provided herein. For example, a system for processing a substrate includes a process chamber comprising a first processing volume and a second processing volume, a carrier disposed in the first processing volume, comprising a first thermoelectric...

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Bibliographische Detailangaben
Hauptverfasser: Thirunavukarasu, Sriskantharajah, Tan, Puay Han, Parathithasan, Karrthik, Tan, Chin Wei, Teo, Wei Jie Dickson, Su, Jun-Liang, Lim, Fang Jie
Format: Patent
Sprache:eng
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