Method for forming an insulation layer in a semiconductor body and transistor device

A method includes forming a trench in a first surface in an edge region of a semiconductor body, forming a plurality of superjunction transistor cells in an inner region of a semiconductor body, and forming an insulation layer on the first surface of the semiconductor body in the edge region and in...

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Bibliographische Detailangaben
Hauptverfasser: Weber, Hans, Fachmann, Christian, Kaindl, Winfried, Hirler, Franz, Rochel, Markus
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method includes forming a trench in a first surface in an edge region of a semiconductor body, forming a plurality of superjunction transistor cells in an inner region of a semiconductor body, and forming an insulation layer on the first surface of the semiconductor body in the edge region and in the inner region, wherein forming the insulation layer includes a thermal oxidation process.