Inspection support system

Provided is an inspection support system capable of improving work efficiency or work accuracy in inspection of structures. A self-traveling apparatus autonomously travels in response to a first travel command based on a first inspection image to a target position, and shoots photographing targets c...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Yamasaki, Fuminori, Karino, Takashi
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING CONTROLLING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION REGULATING SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES TESTING
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Beschreibung
Zusammenfassung:	Provided is an inspection support system capable of improving work efficiency or work accuracy in inspection of structures. A self-traveling apparatus autonomously travels in response to a first travel command based on a first inspection image to a target position, and shoots photographing targets captured in the first inspection image to acquire a second inspection image; and an information processing apparatus extracts, from among the photographing targets captured in the second inspection image, a matched target that matches the photographing target captured in the first inspection image, and correlates the identification information that identifies, in an identifiable manner, the photographing targets that are captured in the first inspection image and are matched to the matched target, with the matched target.