Method for inspecting display device and method for fabricating display device

A method for inspecting a display device includes preparing a target substrate comprising sub-pixels in which light-emitting elements are disposed, dividing each of first regions of the sub-pixels into second regions, obtaining a gray value of each of the second regions, generating a random number u...

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Bibliographische Detailangaben
Hauptverfasser: Lee, Hyung Jin, Oh, Se Yoon, Ye, Sang Heon
Format: Patent
Sprache:eng
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Zusammenfassung:A method for inspecting a display device includes preparing a target substrate comprising sub-pixels in which light-emitting elements are disposed, dividing each of first regions of the sub-pixels into second regions, obtaining a gray value of each of the second regions, generating a random number using the gray value, calculating a representative value of each of the first regions by reflecting variables in the random number, and summing the representative values of the first regions to calculate a number of light-emitting elements of the sub-pixels.