Estimation model generation method and electron microscope

An aberration value estimator has a learned estimation model for estimating an aberration value set based on a Ronchigram. In a machine learning sub-system, a simulation is repeatedly executed while changing a simulation condition, and calculated Ronchigrams are generated in a wide variety and in a...

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Hauptverfasser: Morishita, Shigeyuki, Sagawa, Ryusuke, Uematsu, Fuminori, Nakamichi, Tomohiro, Aibara, Keito
Format: Patent
Sprache:eng
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Zusammenfassung:An aberration value estimator has a learned estimation model for estimating an aberration value set based on a Ronchigram. In a machine learning sub-system, a simulation is repeatedly executed while changing a simulation condition, and calculated Ronchigrams are generated in a wide variety and in a large number. By machine learning using the calculated Ronchigrams, the learned estimation model is generated.