Scrub operations with row error information

Methods, systems, and devices for scrub operations with row error information are described. A memory device may include a memory array with a set of rows. During a scrub operation, the memory device may read data and error control information stored in a row of the memory array and detect a quantity of errors in the row. The memory device may store the quantity of detected errors in the row of the memory device during the scrub operation in memory cells of the memory array storing data associated with the row of the memory array. In some cases, the memory device may then determine that the row is associated with a decreased reliability based on the stored quantity of errors detected in the row during the scrub operation. Here, the memory device may reconfigure the memory array to store the data of the row in another row.