Inspection system and inspection method

To shorten a waiting time for a belongings inspection, the present invention provides an inspection system 10 including: an electromagnetic wave transmission/reception unit 11 that irradiates an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less tha...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Morimoto, Shinichi, Ariyoshi, Masayuki, Sekido, Masanori, Nakayama, Naoya
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	To shorten a waiting time for a belongings inspection, the present invention provides an inspection system 10 including: an electromagnetic wave transmission/reception unit 11 that irradiates an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter, and receives a reflection wave; a detection unit 12 that performs detection processing, based on a signal of the reflection wave; a decision unit 13 that decides a path in which an inspection target person advances, based on a result of the detection processing; and a guide unit 14 that performs processing of guiding the inspection target person to a decided path.