Systems and methods for testing multiple mmWave antennas

A testing system may include a test electronic device having a test antenna disposed in a first signal path of a first antenna array of an electronic device. The test antenna may receive a first signal from the first antenna array. The testing system may also include a reflector disposed in a second...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Rajagopalan, Harish, Ng, Sze Yang Dennis, Shen, Jr-Yi
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A testing system may include a test electronic device having a test antenna disposed in a first signal path of a first antenna array of an electronic device. The test antenna may receive a first signal from the first antenna array. The testing system may also include a reflector disposed in a second signal path of a second antenna array of the electronic device. The reflector may reflect a second signal from the second antenna array to the test antenna. The reflector may include a flat, parabolic, or elliptical curvature that reflects a radio frequency signal emitted by the second antenna array to the test antenna.