Real-time, in-situ reliability monitoring in an integrated circuit

Real-time, in-situ reliability monitoring in an integrated circuit

An Integrated Circuit (IC) includes an electronic circuit and reliability monitoring circuitry. The electronic circuit includes multiple electronic components. The reliability monitoring circuitry is configured to assess, during operation of the IC in a host system, one or more parameters indicative...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Chang, Runzi
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:An Integrated Circuit (IC) includes an electronic circuit and reliability monitoring circuitry. The electronic circuit includes multiple electronic components. The reliability monitoring circuitry is configured to assess, during operation of the IC in a host system, one or more parameters indicative of a reliability of one or more components-of-interest, selected from among the electronic components, and to provide an output indicative of the reliability.