Porous polyurethane polishing pad and process for producing the same

Embodiments relate to a porous polyurethane polishing pad for use in a chemical mechanical planarization (CMP) process of semiconductors and a process for preparing the same. According to the embodiments, the size and distribution of the plurality of pores contained in the porous polyurethane polish...

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Bibliographische Detailangaben
Hauptverfasser: Heo, Hye Young, Yun, Jong Wook, Ahn, Jaein, Seo, Jang Won, Yun, Sunghoon
Format: Patent
Sprache:eng
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Zusammenfassung:Embodiments relate to a porous polyurethane polishing pad for use in a chemical mechanical planarization (CMP) process of semiconductors and a process for preparing the same. According to the embodiments, the size and distribution of the plurality of pores contained in the porous polyurethane polishing pad can be adjusted. Thus, it is possible to provide a porous polyurethane polishing pad that has enhanced physical properties such as a proper level of withstand voltage, excellent polishing performance (i.e., polishing rate), and the like.