System for microscopic examination of an incubated sample

A system for microscopic examination of a sample has a microscope and an incubation environment conditioning unit connected to the microscope. The microscope has a microscope housing enclosing an illumination optics, a microscope stage and an imaging optics, an integrated sample chamber located with...

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Bibliographische Detailangaben
1. Verfasser: Christ, Stefan
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A system for microscopic examination of a sample has a microscope and an incubation environment conditioning unit connected to the microscope. The microscope has a microscope housing enclosing an illumination optics, a microscope stage and an imaging optics, an integrated sample chamber located within the microscope housing and formed by a separated housing section within the microscope housing. The housing section has a microscope interface for connecting the incubation environment conditioning unit to the sample chamber and/or to a stage top chamber for placing within the sample chamber and for receiving the sample. The system provides a first and a second incubation modes. In the first incubation mode the sample chamber is incubated by supply of a first incubation atmosphere by the incubation environment conditioning unit. In the second incubation mode the stage top chamber is incubated by supply of a second incubation atmosphere by the incubation environment conditioning unit.