Analytics for an automated application testing platform

Machine learning techniques are employed to model test runs of an automated test platform in ways that allow for reliable identification of various types of test behavior such as, for example, whether certain classes of failures can be characterized as test flake.

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Bibliographische Detailangaben
Hauptverfasser: Henrikson, Robert, Sandberg, Jean, Vidal, Fernando, Bromann, Christian, Adelberg, Bradley Scott
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Machine learning techniques are employed to model test runs of an automated test platform in ways that allow for reliable identification of various types of test behavior such as, for example, whether certain classes of failures can be characterized as test flake.