System for tear analysis of films

A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; and a tear analysis device configured to tear the film sample and measure a characteristic of the tear. The movable sy...

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Bibliographische Detailangaben
Hauptverfasser: Collick, Scott J, Wang, Jin, Gunther, Robert A, Solanki, Sanjay C, McCarty, II, Donald L, Myers, Kyle A
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; and a tear analysis device configured to tear the film sample and measure a characteristic of the tear. The movable system is configured to move the film sample in the material holder system to the tear analysis device.