Inline x-ray measurement apparatus and method

An x-ray inspection apparatus may comprise an x-ray source, an x-ray detector, and a drive assembly. The drive assembly may be configured to lift a part carrier such that the part carrier is disengaged from a feed assembly and an object mounted on the part carrier is positioned between the x-ray sou...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	Kirschenman, Mark B
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An x-ray inspection apparatus may comprise an x-ray source, an x-ray detector, and a drive assembly. The drive assembly may be configured to lift a part carrier such that the part carrier is disengaged from a feed assembly and an object mounted on the part carrier is positioned between the x-ray source and the x-ray detector. The feed assembly may be configured to feed part carriers into and out of the x-ray inspection apparatus. The drive assembly may be further configured to subsequently lower the part carrier such that the part carrier is reengaged with the feed assembly.