Method, system and apparatus for detecting device malfunctions

An example method of detecting device malfunctions at a subject device includes: obtaining a device event indicator representing an event detected at a device sensor of the subject device; obtaining an external event indicator representing an external event detected by an environmental sensor, the e...

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1. Verfasser: Astvatsaturov, Yuri
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creator Astvatsaturov, Yuri
description An example method of detecting device malfunctions at a subject device includes: obtaining a device event indicator representing an event detected at a device sensor of the subject device; obtaining an external event indicator representing an external event detected by an environmental sensor, the external event occurring external to the subject device; and identifying a device malfunction at the subject device based on the device event indicator and the external event indicator.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11711259B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11711259B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11711259B23</originalsourceid><addsrcrecordid>eNrjZLDzTS3JyE_RUSiuLC5JzVVIzEtRSCwoSCxKLCktVkjLL1JISS1JTS7JzEsHssoyk1MVchNz0krzgEL5ecU8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSQ-NNjQ0NzQ0MjU0snImBg1AGcgMOY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method, system and apparatus for detecting device malfunctions</title><source>esp@cenet</source><creator>Astvatsaturov, Yuri</creator><creatorcontrib>Astvatsaturov, Yuri</creatorcontrib><description>An example method of detecting device malfunctions at a subject device includes: obtaining a device event indicator representing an event detected at a device sensor of the subject device; obtaining an external event indicator representing an external event detected by an environmental sensor, the external event occurring external to the subject device; and identifying a device malfunction at the subject device based on the device event indicator and the external event indicator.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; PHYSICS ; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230725&amp;DB=EPODOC&amp;CC=US&amp;NR=11711259B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230725&amp;DB=EPODOC&amp;CC=US&amp;NR=11711259B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Astvatsaturov, Yuri</creatorcontrib><title>Method, system and apparatus for detecting device malfunctions</title><description>An example method of detecting device malfunctions at a subject device includes: obtaining a device event indicator representing an event detected at a device sensor of the subject device; obtaining an external event indicator representing an external event detected by an environmental sensor, the external event occurring external to the subject device; and identifying a device malfunction at the subject device based on the device event indicator and the external event indicator.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRICITY</subject><subject>PHYSICS</subject><subject>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDzTS3JyE_RUSiuLC5JzVVIzEtRSCwoSCxKLCktVkjLL1JISS1JTS7JzEsHssoyk1MVchNz0krzgEL5ecU8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSQ-NNjQ0NzQ0MjU0snImBg1AGcgMOY</recordid><startdate>20230725</startdate><enddate>20230725</enddate><creator>Astvatsaturov, Yuri</creator><scope>EVB</scope></search><sort><creationdate>20230725</creationdate><title>Method, system and apparatus for detecting device malfunctions</title><author>Astvatsaturov, Yuri</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11711259B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRICITY</topic><topic>PHYSICS</topic><topic>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</topic><toplevel>online_resources</toplevel><creatorcontrib>Astvatsaturov, Yuri</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Astvatsaturov, Yuri</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method, system and apparatus for detecting device malfunctions</title><date>2023-07-25</date><risdate>2023</risdate><abstract>An example method of detecting device malfunctions at a subject device includes: obtaining a device event indicator representing an event detected at a device sensor of the subject device; obtaining an external event indicator representing an external event detected by an environmental sensor, the external event occurring external to the subject device; and identifying a device malfunction at the subject device based on the device event indicator and the external event indicator.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRIC DIGITAL DATA PROCESSING
ELECTRICITY
PHYSICS
TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
title Method, system and apparatus for detecting device malfunctions
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T07%3A08%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Astvatsaturov,%20Yuri&rft.date=2023-07-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11711259B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true