Method, system and apparatus for detecting device malfunctions
An example method of detecting device malfunctions at a subject device includes: obtaining a device event indicator representing an event detected at a device sensor of the subject device; obtaining an external event indicator representing an external event detected by an environmental sensor, the e...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | An example method of detecting device malfunctions at a subject device includes: obtaining a device event indicator representing an event detected at a device sensor of the subject device; obtaining an external event indicator representing an external event detected by an environmental sensor, the external event occurring external to the subject device; and identifying a device malfunction at the subject device based on the device event indicator and the external event indicator. |
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