Sensor test apparatus

A sensor test apparatus capable of efficiently testing a sensor is provided.A sensor test apparatus 30 which tests the pressure sensor 90 includes an application unit 40 including an application device 42 including a socket 445 to which the sensor 90 is electronically connected, a pressure chamber 4...

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Hauptverfasser: Hayakawa, Atsushi, Nishizaki, Hisao, Takano, Daisuke, Chiba, Michiro, Hanamura, Satoshi, Suga, Kazunari
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creator Hayakawa, Atsushi
Nishizaki, Hisao
Takano, Daisuke
Chiba, Michiro
Hanamura, Satoshi
Suga, Kazunari
description A sensor test apparatus capable of efficiently testing a sensor is provided.A sensor test apparatus 30 which tests the pressure sensor 90 includes an application unit 40 including an application device 42 including a socket 445 to which the sensor 90 is electronically connected, a pressure chamber 43 which applies pressure to the sensor 90, and a heat sink 443,462 which applies a thermal stress to the sensor 90, the test unit 35 which tests the sensor 90 via the socket 445, and the conveying robot 33 which conveys the sensor 90 into and out of the application unit 40.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11693049B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11693049B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11693049B23</originalsourceid><addsrcrecordid>eNrjZBANTs0rzi9SKEktLlFILChILEosKS3mYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGhmaWxgYmlk5GxsSoAQCJ9iF9</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Sensor test apparatus</title><source>esp@cenet</source><creator>Hayakawa, Atsushi ; Nishizaki, Hisao ; Takano, Daisuke ; Chiba, Michiro ; Hanamura, Satoshi ; Suga, Kazunari</creator><creatorcontrib>Hayakawa, Atsushi ; Nishizaki, Hisao ; Takano, Daisuke ; Chiba, Michiro ; Hanamura, Satoshi ; Suga, Kazunari</creatorcontrib><description>A sensor test apparatus capable of efficiently testing a sensor is provided.A sensor test apparatus 30 which tests the pressure sensor 90 includes an application unit 40 including an application device 42 including a socket 445 to which the sensor 90 is electronically connected, a pressure chamber 43 which applies pressure to the sensor 90, and a heat sink 443,462 which applies a thermal stress to the sensor 90, the test unit 35 which tests the sensor 90 via the socket 445, and the conveying robot 33 which conveys the sensor 90 into and out of the application unit 40.</description><language>eng</language><subject>CHAMBERS PROVIDED WITH MANIPULATION DEVICES ; HAND TOOLS ; MANIPULATORS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PERFORMING OPERATIONS ; PHYSICS ; PORTABLE POWER-DRIVEN TOOLS ; TESTING ; TRANSPORTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230704&amp;DB=EPODOC&amp;CC=US&amp;NR=11693049B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230704&amp;DB=EPODOC&amp;CC=US&amp;NR=11693049B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Hayakawa, Atsushi</creatorcontrib><creatorcontrib>Nishizaki, Hisao</creatorcontrib><creatorcontrib>Takano, Daisuke</creatorcontrib><creatorcontrib>Chiba, Michiro</creatorcontrib><creatorcontrib>Hanamura, Satoshi</creatorcontrib><creatorcontrib>Suga, Kazunari</creatorcontrib><title>Sensor test apparatus</title><description>A sensor test apparatus capable of efficiently testing a sensor is provided.A sensor test apparatus 30 which tests the pressure sensor 90 includes an application unit 40 including an application device 42 including a socket 445 to which the sensor 90 is electronically connected, a pressure chamber 43 which applies pressure to the sensor 90, and a heat sink 443,462 which applies a thermal stress to the sensor 90, the test unit 35 which tests the sensor 90 via the socket 445, and the conveying robot 33 which conveys the sensor 90 into and out of the application unit 40.</description><subject>CHAMBERS PROVIDED WITH MANIPULATION DEVICES</subject><subject>HAND TOOLS</subject><subject>MANIPULATORS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PORTABLE POWER-DRIVEN TOOLS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBANTs0rzi9SKEktLlFILChILEosKS3mYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxocGGhmaWxgYmlk5GxsSoAQCJ9iF9</recordid><startdate>20230704</startdate><enddate>20230704</enddate><creator>Hayakawa, Atsushi</creator><creator>Nishizaki, Hisao</creator><creator>Takano, Daisuke</creator><creator>Chiba, Michiro</creator><creator>Hanamura, Satoshi</creator><creator>Suga, Kazunari</creator><scope>EVB</scope></search><sort><creationdate>20230704</creationdate><title>Sensor test apparatus</title><author>Hayakawa, Atsushi ; Nishizaki, Hisao ; Takano, Daisuke ; Chiba, Michiro ; Hanamura, Satoshi ; Suga, Kazunari</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11693049B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>CHAMBERS PROVIDED WITH MANIPULATION DEVICES</topic><topic>HAND TOOLS</topic><topic>MANIPULATORS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PORTABLE POWER-DRIVEN TOOLS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Hayakawa, Atsushi</creatorcontrib><creatorcontrib>Nishizaki, Hisao</creatorcontrib><creatorcontrib>Takano, Daisuke</creatorcontrib><creatorcontrib>Chiba, Michiro</creatorcontrib><creatorcontrib>Hanamura, Satoshi</creatorcontrib><creatorcontrib>Suga, Kazunari</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hayakawa, Atsushi</au><au>Nishizaki, Hisao</au><au>Takano, Daisuke</au><au>Chiba, Michiro</au><au>Hanamura, Satoshi</au><au>Suga, Kazunari</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Sensor test apparatus</title><date>2023-07-04</date><risdate>2023</risdate><abstract>A sensor test apparatus capable of efficiently testing a sensor is provided.A sensor test apparatus 30 which tests the pressure sensor 90 includes an application unit 40 including an application device 42 including a socket 445 to which the sensor 90 is electronically connected, a pressure chamber 43 which applies pressure to the sensor 90, and a heat sink 443,462 which applies a thermal stress to the sensor 90, the test unit 35 which tests the sensor 90 via the socket 445, and the conveying robot 33 which conveys the sensor 90 into and out of the application unit 40.</abstract><oa>free_for_read</oa></addata></record>
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subjects CHAMBERS PROVIDED WITH MANIPULATION DEVICES
HAND TOOLS
MANIPULATORS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PERFORMING OPERATIONS
PHYSICS
PORTABLE POWER-DRIVEN TOOLS
TESTING
TRANSPORTING
title Sensor test apparatus
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-14T00%3A21%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Hayakawa,%20Atsushi&rft.date=2023-07-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11693049B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true