Metallization structures under a semiconductor device layer

Metallization structures under a semiconductor device layer. A metallization structure in alignment with semiconductor fin may be on a side of the fin opposite a gate stack. Backside and/or frontside substrate processing techniques may be employed to form such metallization structures on a bottom of...

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Bibliographische Detailangaben
Hauptverfasser: Cea, Stephen M, Morrow, Patrick, Lilak, Aaron D, Mehandru, Rishabh
Format: Patent
Sprache:eng
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Zusammenfassung:Metallization structures under a semiconductor device layer. A metallization structure in alignment with semiconductor fin may be on a side of the fin opposite a gate stack. Backside and/or frontside substrate processing techniques may be employed to form such metallization structures on a bottom of a semiconductor fin or between bottom portions of two adjacent fins. Such metallization structures may accompany interconnect metallization layers that are over a gate stack, for example to increase metallization layer density for a given number of semiconductor device layers.