System and method for non-ionizing non-destructive detection of structural defects in materials
A means to enable the inspection of industrial materials in order to see hidden structural defects that can lead to an early failure, using electromagnetic fields and harmonic waves.
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| creator | Rembach, Olena Oleksandrivna Kalenychenko, Yurii Oleksandrovych Kalenychenko, Oleksandr Hryhorovych |
| description | A means to enable the inspection of industrial materials in order to see hidden structural defects that can lead to an early failure, using electromagnetic fields and harmonic waves. |
| format | Patent |
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| subjects | DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | System and method for non-ionizing non-destructive detection of structural defects in materials |
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