System and method for non-ionizing non-destructive detection of structural defects in materials

A means to enable the inspection of industrial materials in order to see hidden structural defects that can lead to an early failure, using electromagnetic fields and harmonic waves.

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Bibliographische Detailangaben
Hauptverfasser:	Rembach, Olena Oleksandrivna, Kalenychenko, Yurii Oleksandrovych, Kalenychenko, Oleksandr Hryhorovych
Format:	Patent
Sprache:	eng
Schlagworte:	DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A means to enable the inspection of industrial materials in order to see hidden structural defects that can lead to an early failure, using electromagnetic fields and harmonic waves.