Automated data processing and machine learning model generation

Automated data processing and machine learning model generation

A device may obtain first data relating to a machine learning model. The device may pre-process the first data to alter the first data to generate second data. The device may process the second data to select a set of features from the second data. The device may analyze the set of features to evalu...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Chinnadurai, Easwer, Prabha, Niju, Pallail, Gayathri, Aeck, Jérémy, Grenet, Charles, Prasad, Srikanth, Jetley, Pankaj, Prasad, Rajendra T, Kulkarni, Aditi, Sun, Xiwen, Han, Liang, Higgins, Luke, Xi, Yuqing, Vijayaraghavan, Koushik M, Depoitre, Jean-Francois, Sridevi, Jayashri
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Beschreibung
Zusammenfassung:A device may obtain first data relating to a machine learning model. The device may pre-process the first data to alter the first data to generate second data. The device may process the second data to select a set of features from the second data. The device may analyze the set of features to evaluate a plurality of types of machine learning models with respect to the set of features. The device may select a particular type of machine learning model for the set of features based on analyzing the set of features to evaluate the plurality of types of machine learning models. The device may tune a set of parameters of the particular type of machine learning model to train the machine learning model. The device may receive third data for prediction. The device may provide a prediction using the particular type of machine learning model.