Device and method for operating a test stand

A device and a method for operating a test stand. A set of measurements of input variables of a system model of a component of a machine is provided. An optimization problem is defined using a set of measurements of input variables. A gradient for solving the optimization problem is determined as a...

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Bibliographische Detailangaben
Hauptverfasser:	Schiegg, Martin, Gerwinn, Sebastian
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	A device and a method for operating a test stand. A set of measurements of input variables of a system model of a component of a machine is provided. An optimization problem is defined using a set of measurements of input variables. A gradient for solving the optimization problem is determined as a function of the set of measurements. A solution to the optimization problem, which defines a design for input data for the test stand for a measurement on the component, is determined as a function of the gradient. A measurement of output data is acquired on the component on the test stand as a function of the input data. Pairs of training input data and training output data are determined as a function of the input data and the measurement of output data. The system model for the component is trained as a function of the pairs.