Inspection apparatus and inspection method for inspection target

Whether an internal defect is present in an inspection target is readily judged. Provided is an inspection method for an inspection target that is a layered structure including an FRP material and/or a structure made of resin, the method including the steps of: tapping, with a tapping tool, an inspe...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Miyake, Hisao, Fujioka, Yoshihiro, Morii, Yoshiyuki
Format:	Patent
Sprache:	eng
Schlagworte:	AEROPLANES AIRCRAFT AVIATION COSMONAUTICS HELICOPTERS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR TRANSPORTING
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Beschreibung
Zusammenfassung:	Whether an internal defect is present in an inspection target is readily judged. Provided is an inspection method for an inspection target that is a layered structure including an FRP material and/or a structure made of resin, the method including the steps of: tapping, with a tapping tool, an inspection target area on a surface of the inspection target; detecting, by an accelerometer mounted to the tapping tool, an acceleration signal corresponding to acceleration of the tapping tool due to reaction force against the tapping; recording waveform data about the detected acceleration signal; creating a contour map corresponding to the inspection target area, based on the recorded waveform data; displaying the contour map on a display unit; and judging whether an internal defect is present in the inspection target, based on the contour map displayed on the display unit.