Prediction of device properties

In order to predict properties of a first device, data is obtained relating to properties of second devices having characteristics in common with the first device. The data comprises values of a first parameter at specific values of a second parameter. The data is organized in a first matrix with each row or column representing one value of the second parameter, and each column or row contains for one of the second devices the value of the first parameter at each of the values of the second parameter for which data is available. The first matrix is factorized into a second matrix and a third matrix. The second matrix represents a relationship between the second parameter and hidden features. The third matrix represents a relationship between the second devices and hidden features. The second matrix and/or the third matrix is used to predict at least one value of the first parameter and at least one respective specific value of the second parameter outside a predetermined range.