Measuring dynamic light scattering of a sample

The present disclosure describes a method and apparatus of measuring dynamic light scattering of a sample. In an embodiment, the apparatus includes a platen, a light source underneath the platen and configured to emit emitted light through the platen and into the sample, collector optics underneath...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	Trainoff, Steven P
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present disclosure describes a method and apparatus of measuring dynamic light scattering of a sample. In an embodiment, the apparatus includes a platen, a light source underneath the platen and configured to emit emitted light through the platen and into the sample, collector optics underneath the platen and configured to capture scattered light, and an optical absorber configured to be in contact with the sample, configured to absorb transmitted light, and configured to redirect reflected light away from the collector optics. In an embodiment, the method includes depositing a sample on a platen, emitting emitted light from a light source underneath the platen through the platen and into the sample, capturing via collector optics underneath the platen scattered light, contacting the sample with an optical absorber, absorbing via the absorber transmitted light, and redirecting via the absorber reflected light away from the collector optics.