System and method for detecting product defects across manufacturing process

Disclosed herein is method and fault detection system for detecting faults in one or more products. In an embodiment, method comprises generating plurality of wavelet coefficients corresponding to transformed images of each of the one or more products and determining a set of invariant features from...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Nagaraj, Chandrashekar Bangalore, Soppin, Shashidhar, Iyer, Manjunath Ramachandra
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
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