System and method for detecting product defects across manufacturing process

Disclosed herein is method and fault detection system for detecting faults in one or more products. In an embodiment, method comprises generating plurality of wavelet coefficients corresponding to transformed images of each of the one or more products and determining a set of invariant features from the plurality of wavelet coefficients. Further, a dynamic set of invariant features is generated by grouping invariant features into a set of groups based on type of the one or more products. Subsequently, the dynamic set of invariant features is quantized based on a predetermined quantization threshold and a representative coefficient signature is associated for each group in the dynamic set of invariant features. Finally, faults in the one or more products are detected by comparing coefficient signatures associated with the one or more products with the representative coefficient signature of each group in the dynamic set of invariant features. In an embodiment, the present disclosure helps in accurate detection of faults in one or more products irrespective of type and characteristics of one or more products.