Semiconductor device

A method for fabricating a semiconductor device includes forming a first wiring layer, the first wiring layer including a first metal wiring and a first interlayer insulating film wrapping the first metal wiring on a substrate, forming a first via layer, the first via layer including a first via tha...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Moon, Hyo Jeong, Park, Seung Jong, Bae, Seul Gi, Park, Jae Wha, Kim, Jun Kwan, Kim, Moon Keun
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for fabricating a semiconductor device includes forming a first wiring layer, the first wiring layer including a first metal wiring and a first interlayer insulating film wrapping the first metal wiring on a substrate, forming a first via layer, the first via layer including a first via that is in electrical connection with the first metal wiring, and a second interlayer insulating film wrapping the first via on the first wiring layer, and forming a second wiring layer, the second wiring layer including a second metal wiring that is in electrical connection with the first via, and a third interlayer insulating film wrapping the second metal wiring on the first via layer, wherein the third interlayer insulating film contains deuterium and is formed through chemical vapor deposition using a first gas containing deuterium and a second gas containing hydrogen.