System, apparatus and method for facilitating inspection of a target object

A system, apparatus and method are provided for facilitating inspection of a target object. In the context of a method, an image is received that includes the target object. The method applies a first mask to at least a portion of the image in order to mask one or more foreground objects that at lea...

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Bibliographische Detailangaben
1. Verfasser:	Coffman, Mathew Albert
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A system, apparatus and method are provided for facilitating inspection of a target object. In the context of a method, an image is received that includes the target object. The method applies a first mask to at least a portion of the image in order to mask one or more foreground objects that at least partially block view of the target object. The method further includes applying a second mask to at least a portion of the image in order to mask a background of the target object. The method additionally includes analyzing the image of the target object following application of the first and second masks in order to identify one or more regions of the target object that merit further inspection. A corresponding system and apparatus are also provided.