Defect detection for multi-function devices using machine learning

Defect detection for multi-function devices using machine learning

A method is disclosed. For example, the method executed by a processor of a multi-function device (MFD) includes executing a defect learning routine to identify defects, cataloging the defects based on a job function, a type of paper, and a machine state, receiving a job request, determining a known...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Moore, Lee C, Craig, David C, Robles Flores, Eliud, Roberts Conlon, Paul
Format: Patent
Sprache:eng
Schlagworte:
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
PICTORIAL COMMUNICATION, e.g. TELEVISION
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Beschreibung
Zusammenfassung:A method is disclosed. For example, the method executed by a processor of a multi-function device (MFD) includes executing a defect learning routine to identify defects, cataloging the defects based on a job function, a type of paper, and a machine state, receiving a job request, determining a known defect that has been catalogued based on the job function, the type of paper, and the machine state, and presenting a visualization of the known defect on a display of a user interface before executing the job request.