System, apparatus and method for providing an inspection map

Systems, apparatus and methods for providing an inspection map are disclosed. An apparatus for performing an inspection may include an inspection data circuit to interpret inspection data, a robot positioning circuit to interpret position data, and a processed data circuit to link the inspection dat...

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Bibliographische Detailangaben
Hauptverfasser: Cho, Edwin H, Rodriguez, Domenic P, Gu, Yizhu, Bryner, Edward A, Trogu, Francesco H, Miller, Ian, MacKenzie, Logan A, Cho, Mark, Low, Kevin Y, Guise, Benjamin A, Jourde, Dillon R, Joslin, Todd, Loosararian, Mark J, Moore, Joshua D, Watt, Alexander C
Format: Patent
Sprache:eng
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Zusammenfassung:Systems, apparatus and methods for providing an inspection map are disclosed. An apparatus for performing an inspection may include an inspection data circuit to interpret inspection data, a robot positioning circuit to interpret position data, and a processed data circuit to link the inspection data with the position data to determine position-based inspection data. The apparatus may further include a user interaction circuit to interpret an inspection visualization request for an inspection map and an inspection visualization circuit to determine the inspection map based on the position-based inspection data, and a provisioning circuit structured to provide the inspection map to a user device.