RRAM filament location based on NIR emission

RRAM filament location based on NIR emission

Methods and systems for locating a filament in a resistive memory device are described. In an example, a device can acquire an image indicating an occurrence of photoemission from the resistive memory device. The device can determine a location of the filament in a switching medium of the resistive...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Frank, Martin Michael, Cartier, Eduard Albert, Song, Peilin, Pfeiffer, Dirk, Stellari, Franco, Cabral, Jr., Cyril, Ando, Takashi
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:Methods and systems for locating a filament in a resistive memory device are described. In an example, a device can acquire an image indicating an occurrence of photoemission from the resistive memory device. The device can determine a location of the filament in a switching medium of the resistive memory device using the acquired image.