Refractive-index sensor and method

Refractive-index sensor and method

A method for measuring a refractive index of a medium includes exciting a first antisymmetric resonance of a first metasurface, including a first periodic array of resonators formed on a substrate surface, with illumination incident on the first metasurface at a non-normal incidence angle with respe...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Escarra, Matthew David, Ollanik, Adam
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method for measuring a refractive index of a medium includes exciting a first antisymmetric resonance of a first metasurface, including a first periodic array of resonators formed on a substrate surface, with illumination incident on the first metasurface at a non-normal incidence angle with respect to the substrate surface, the first metasurface including the medium encapsulating the first periodic array of resonators. The method also includes determining a refractive index of the medium from a first amplitude of a first transmitted signal that includes a portion of the illumination transmitted through the first metasurface.