Position detection system and method for detecting a movement of a machine

A position detection system for detecting a movement of a machine includes a first and a second position sensor and an evaluation device. The first position sensor is configured to detect a change in a first magnetic field generated by the movement of the machine. The second position sensor is confi...

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Hauptverfasser: Bund, Gerhard, Stollberger, Stephanie
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creator Bund, Gerhard
Stollberger, Stephanie
description A position detection system for detecting a movement of a machine includes a first and a second position sensor and an evaluation device. The first position sensor is configured to detect a change in a first magnetic field generated by the movement of the machine. The second position sensor is configured to detect a change in a second magnetic field, which differs from the first magnetic field and is generated by the movement of the machine. A detection result from the second position sensor has a lower resolution of a position of an element of the machine to be determined than a detection result from the first position sensor. The evaluation device is configured to evaluate the detection result from the first position sensor and/or the detection result from the second position sensor to determine the position of the element of the machine.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US11499842B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US11499842B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US11499842B23</originalsourceid><addsrcrecordid>eNrjZPAKyC_OLMnMz1NISS1JTQaziiuLS1JzFRLzUhRyU0sy8lMU0vKLYPJ56QqJCrn5Zam5qXklCvlpIF5ickZmXioPA2taYk5xKi-U5mZQdHMNcfbQTS3Ij08tLkhMTs1LLYkPDTY0NLG0tDAxcjIyJkYNAB62NRM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Position detection system and method for detecting a movement of a machine</title><source>esp@cenet</source><creator>Bund, Gerhard ; Stollberger, Stephanie</creator><creatorcontrib>Bund, Gerhard ; Stollberger, Stephanie</creatorcontrib><description>A position detection system for detecting a movement of a machine includes a first and a second position sensor and an evaluation device. The first position sensor is configured to detect a change in a first magnetic field generated by the movement of the machine. The second position sensor is configured to detect a change in a second magnetic field, which differs from the first magnetic field and is generated by the movement of the machine. A detection result from the second position sensor has a lower resolution of a position of an element of the machine to be determined than a detection result from the first position sensor. The evaluation device is configured to evaluate the detection result from the first position sensor and/or the detection result from the second position sensor to determine the position of the element of the machine.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221115&amp;DB=EPODOC&amp;CC=US&amp;NR=11499842B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221115&amp;DB=EPODOC&amp;CC=US&amp;NR=11499842B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Bund, Gerhard</creatorcontrib><creatorcontrib>Stollberger, Stephanie</creatorcontrib><title>Position detection system and method for detecting a movement of a machine</title><description>A position detection system for detecting a movement of a machine includes a first and a second position sensor and an evaluation device. The first position sensor is configured to detect a change in a first magnetic field generated by the movement of the machine. The second position sensor is configured to detect a change in a second magnetic field, which differs from the first magnetic field and is generated by the movement of the machine. A detection result from the second position sensor has a lower resolution of a position of an element of the machine to be determined than a detection result from the first position sensor. The evaluation device is configured to evaluate the detection result from the first position sensor and/or the detection result from the second position sensor to determine the position of the element of the machine.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAKyC_OLMnMz1NISS1JTQaziiuLS1JzFRLzUhRyU0sy8lMU0vKLYPJ56QqJCrn5Zam5qXklCvlpIF5ickZmXioPA2taYk5xKi-U5mZQdHMNcfbQTS3Ij08tLkhMTs1LLYkPDTY0NLG0tDAxcjIyJkYNAB62NRM</recordid><startdate>20221115</startdate><enddate>20221115</enddate><creator>Bund, Gerhard</creator><creator>Stollberger, Stephanie</creator><scope>EVB</scope></search><sort><creationdate>20221115</creationdate><title>Position detection system and method for detecting a movement of a machine</title><author>Bund, Gerhard ; Stollberger, Stephanie</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US11499842B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Bund, Gerhard</creatorcontrib><creatorcontrib>Stollberger, Stephanie</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bund, Gerhard</au><au>Stollberger, Stephanie</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Position detection system and method for detecting a movement of a machine</title><date>2022-11-15</date><risdate>2022</risdate><abstract>A position detection system for detecting a movement of a machine includes a first and a second position sensor and an evaluation device. The first position sensor is configured to detect a change in a first magnetic field generated by the movement of the machine. The second position sensor is configured to detect a change in a second magnetic field, which differs from the first magnetic field and is generated by the movement of the machine. A detection result from the second position sensor has a lower resolution of a position of an element of the machine to be determined than a detection result from the first position sensor. The evaluation device is configured to evaluate the detection result from the first position sensor and/or the detection result from the second position sensor to determine the position of the element of the machine.</abstract><oa>free_for_read</oa></addata></record>
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
title Position detection system and method for detecting a movement of a machine
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T07%3A16%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Bund,%20Gerhard&rft.date=2022-11-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS11499842B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true