Position detection system and method for detecting a movement of a machine

A position detection system for detecting a movement of a machine includes a first and a second position sensor and an evaluation device. The first position sensor is configured to detect a change in a first magnetic field generated by the movement of the machine. The second position sensor is confi...

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Bibliographische Detailangaben
Hauptverfasser:	Bund, Gerhard, Stollberger, Stephanie
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A position detection system for detecting a movement of a machine includes a first and a second position sensor and an evaluation device. The first position sensor is configured to detect a change in a first magnetic field generated by the movement of the machine. The second position sensor is configured to detect a change in a second magnetic field, which differs from the first magnetic field and is generated by the movement of the machine. A detection result from the second position sensor has a lower resolution of a position of an element of the machine to be determined than a detection result from the first position sensor. The evaluation device is configured to evaluate the detection result from the first position sensor and/or the detection result from the second position sensor to determine the position of the element of the machine.