Memory validation

One example method of testing an electrical device comprises transmitting a data pattern to a memory device of the electrical device by a controller of the electrical device to provide a written data pattern to the memory device, wherein the data pattern replicates a resonant frequency of at least a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Ravikumar, Sabareeshkumar, Wang, Feng, Zhang, Ji, Sun, Shishuang
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:One example method of testing an electrical device comprises transmitting a data pattern to a memory device of the electrical device by a controller of the electrical device to provide a written data pattern to the memory device, wherein the data pattern replicates a resonant frequency of at least a portion of the electrical device, reading the written data pattern from the memory device with the controller, and comparing the written data pattern to the data pattern.