Systems with ADC circuitry and associated methods

A system may include ADC circuitry. To test the performance of the ADC circuitry, the system may include ADC testing circuitry coupled to the ADC circuitry. In particular, the ADC testing circuitry may include reference voltage generation circuitry configured to generate reference voltages serving a...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Balar, Bharat, Sampath, Parthasarthy V
Format:	Patent
Sprache:	eng
Schlagworte:	ANALOGOUS ARRANGEMENTS USING OTHER WAVES BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES ELECTRICITY LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES MEASURING PHYSICS RADIO DIRECTION-FINDING RADIO NAVIGATION TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A system may include ADC circuitry. To test the performance of the ADC circuitry, the system may include ADC testing circuitry coupled to the ADC circuitry. In particular, the ADC testing circuitry may include reference voltage generation circuitry configured to generate reference voltages serving as test voltages for the ADC circuitry. The ADC circuitry may be coupled to a test input for receiving the test voltages via switching circuitry and may be coupled to a main data input for receiving system data via the switching circuitry. Testing may occur during an idling time period of the system and when the switching circuitry couples the test input to the ADC circuitry. Test input voltages corresponding to one or more stages in the ADC circuitry may be provided to the ADC circuitry, and corresponding output values from the ADC circuitry may be compared to an expected value and/or expected threshold values.