Method, apparatus and system for calculating stress parameters and computer device

A method, apparatus and system for calculating stress parameters is provided. The method comprises establishing a first image pyramid according to an image of a sample before deformation, and establishing a second image pyramid corresponding to the first image pyramid according to an image of the sa...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Jia, Kaikai, Deng, Yanchang, Wang, Linlin, Luo, Zhilei
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A method, apparatus and system for calculating stress parameters is provided. The method comprises establishing a first image pyramid according to an image of a sample before deformation, and establishing a second image pyramid corresponding to the first image pyramid according to an image of the sample after deformation; starting from a top level in the first image pyramid, iteratively calculating displacement information on each level in the first image pyramid relative to a corresponding level in the second image pyramid based on a center point of each sub-region at each level in the first image pyramid and other positions in the sub-region; calculating strain information on the sample according to displacement information on a bottom level of the first image pyramid; and calculating stress parameters of the sample based on the strain information.