Analysis device, analysis method, and non-transitory computer readable medium recording an analysis program

To provide an analysis device, an analysis method, and an analysis program capable of analyzing a machining state while associating machine data output during operation of a machine tool and measured data containing the size of an actual machined part measured by a measuring machine with each other....

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Kamiguchi, Masao, Ogawa, Shinichi, Miyahara, Yuuya, Okajima, Yasushi, Kurokami, Noboru
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:To provide an analysis device, an analysis method, and an analysis program capable of analyzing a machining state while associating machine data output during operation of a machine tool and measured data containing the size of an actual machined part measured by a measuring machine with each other. An analysis device comprises: a collection unit that collects an aggregate of machine data output during operation of a machine tool and an aggregate of measured data containing measurement points where the size of a machined part machined by the machine tool has been measured by a measuring instrument; and a feature extraction unit that selects machine data corresponding to an arbitrary measurement point, in the aggregate of the measured data from the aggregate of the machine data, and extracts the selected machine data as a feature at the arbitrary measurement point.