Method of spectroscopically characterizing a surface

Method of spectroscopically characterizing a surface

A device and method for performing reflectivity measurements at a distance by receiving two or more reflected signals (using two or more different wavelength sweeps) and calculating ratios of the two (or more) received reflected signals, for the purpose of determining the composition of a material o...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Ensher, Jason, Wood, Christopher
Format: Patent
Sprache:eng
Schlagworte:
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:A device and method for performing reflectivity measurements at a distance by receiving two or more reflected signals (using two or more different wavelength sweeps) and calculating ratios of the two (or more) received reflected signals, for the purpose of determining the composition of a material or surface at a distance.