Test system

Provided is a test system operable with a simplified structure. A test system includes a first test device and a second test device each of which transports and tests a sample. The test device includes a master control unit, which performs assignment of samples to the first test device and the secon...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Tatsutani, Hiroo, Yamakawa, Nobuyoshi, Ohmae, Yuichiro
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Provided is a test system operable with a simplified structure. A test system includes a first test device and a second test device each of which transports and tests a sample. The test device includes a master control unit, which performs assignment of samples to the first test device and the second test device, and control of a transport operation of the sample assigned to the test device. The test device includes a slave control unit, which controls a transport operation of the sample assigned to the test device by the master control unit.