Auto focus function for vision inspection system

A vision inspection system includes a platform supporting parts for inspection at an inspection zone, an inspection station positioned adjacent the platform at the inspection zone including an imaging device to image the parts in a field of view above the upper surface, and a vision inspection contr...

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Bibliographische Detailangaben
Hauptverfasser:	Lu, Roberto Francisco-Yi, Zhou, Lei, Day, Scott, Zerbe, Jeffrey, Osunkwo, Sonny O
Format:	Patent
Sprache:	eng
Schlagworte:	APPARATUS SPECIALLY ADAPTED THEREFOR CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MATERIALS THEREFOR MEASURING ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A vision inspection system includes a platform supporting parts for inspection at an inspection zone, an inspection station positioned adjacent the platform at the inspection zone including an imaging device to image the parts in a field of view above the upper surface, and a vision inspection controller receiving images from the imaging device. The vision inspection controller includes an auto focus module for orienting the imaging device relative to the inspection zone. The auto focus module determines a working distance for the imaging device from the inspection zone. The auto focus module calculates an image contrast score of pixel values of the images at various working distances from the inspection zone. The vision inspection controller causes the inspection station to operate the imaging device at an imaging working distance corresponding to the working distance associated with the highest image contrast score.