Optoelectronic solar cell test system for an in-line solar cell production plant, and method for optimizing the in-line production of solar cells using an optoelectronic solar cell test system of this type

An optoelectronic solar cell test system including an exposure and measuring device for in-line measurement of solar cells and a control and evaluation unit, the exposure and measuring device configured to carry out test measurements for generating test-measurement data on a solar cell. The control and evaluation unit is configured to perform statistical analyses using data from identical test measurements undertaken by the exposure and measuring device on a plurality of solar cells produced in-line, and to correlate statistical analyses of the data from different test measurements with one another, and/or to correlate statistical analyses of test measurement data with statistical analyses of production measurement data, and/or to correlate statistical analyses of test measurement data and/or statistical analyses of production measurement data with production input data, in order generate correlation results, and to derive from the correlation results, and communicate, an action recommendation or instruction to a personnel group.