Method of manufacturing a semiconductor device

A semiconductor device includes a substrate including a first region and a second region, memory transistors on the first region, a first interconnection layer on the memory transistors and including first interconnection lines, and a second interconnection layer on the first interconnection layer a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Jeong, Lakgyo, Hong, Hee Bum, Yang, Seolun, Cho, Yongrae
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A semiconductor device includes a substrate including a first region and a second region, memory transistors on the first region, a first interconnection layer on the memory transistors and including first interconnection lines, and a second interconnection layer on the first interconnection layer and including second interconnection lines. The second interconnection lines on the first region include a first line extending along a first direction and spaced from the second region by a first distance along the first direction, and a second line extending along the first direction, spaced from the first line along a second direction intersecting the first direction, and having a width smaller than that of the first line. The first line includes a protrusion extending along a third direction toward the substrate. The protrusion is spaced from the second region by a second distance along the first direction greater than the first distance.